Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 6"", 150 mm diameter, <100> Orientation
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Numéro de catalogue. NC1637560
These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side. Diameter: 150 mm Orientation: <100> Thickness: 600-690 m Roughness: 2nm Resistance: 1-30 ohms
Numéro de catalogue.
NC1637560
Fournisseur
Electron Microscopy SciencesCode fournisseur
7189308
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These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side. Diameter: 150 mm Orientation: <100> Thickness: 600-690 m Roughness: 2nm Resistance: 1-30 ohms
