Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 6"", 150 mm diameter, <100> Orientation
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Catalog No. NC1637560
These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side. Diameter: 150 mm Orientation: <100> Thickness: 600-690 m Roughness: 2nm Resistance: 1-30 ohms
Catalog No.
NC1637560
Supplier
Electron Microscopy SciencesSupplier No.
7189308
Please call Customer Service at 1-800-234-7437 or send an email to help@thermofisher.com for assistance.
These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side. Diameter: 150 mm Orientation: <100> Thickness: 600-690 m Roughness: 2nm Resistance: 1-30 ohms
