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Beckman Coulter LS 13 320 XR Multiwavelength (MW) Laser Diffraction Particle Size Analyzer
Multiwavelength Particle Size Analyzer incorporates PIDS to provide a dynamic range down to 0.010 μm. The DPS is capable of measuring dry powder samples, while the ULM analyzes samples suspended in aqueous or non-aqueous dilutents.
Supplier: Beckman Coulter C53019
Description
- Offers particle size distribution data from advanced Polarization Intensity Differential Scattering (PIDS) technology, which enables high-resolution measurements and an expanded dynamic range
- 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
- The XR particle size analyzer provides fast, accurate results, and helps streamline workflows for optimal efficiency
- Dry Powder System (DPS) Module delivers reliable results from 400 nm to 3,500 μm for all types of homogeneous and heterogeneous samples that can be dispersed dry
- Universal Liquid Module (ULM) analyzes samples suspended in aqueous or non-aqueous dilutents ranging in size from 0.010 μm to 2000 μm
- Enhanced software simplifies method creation for standardized measurements
- Provides accurate, reliable detection of multiple particle sizes in a single sample
- New control standards adequately verify instrument/module performance
- ADAPT Software features pass/fail results for faster quality control
- High-security software configuration supports 21 CFR Part 11
- Direct measurement range from 0.010 μm to 3,500 μm
- Requires the LS 13 320 XR Workstation or customer-supplied Windows 10 PC that meets Beckman minimum specifications
Spécifications
| LS 13 320 XR MW Analyzer/DPS | |
| 0.010 μm to 2000 μm | |
| Requires Controller, and Standard LS/HiCap Vacuum Unit |
| LS 13 320 XR MW | |
| Particle Size Analysis of Dry Powder, Aqueous, and Non-Aqueous Samples | |
| Dry Powder System (DPS) |