missing translation for 'onlineSavingsMsg'
Learn More
  1. Home
  2. Products
  3. Counting Devices
  4. Particle Counters
  5. Beckman Coulter LS 13 320 XR Multiwavelength (MW) Laser Diffraction Particle Size Analyzer

Beckman Coulter LS 13 320 XR Multiwavelength (MW) Laser Diffraction Particle Size Analyzer

Catalog No. 15655160
Change view
Click to view available options
Includes:
Dry Powder System (DPS)
Universal Liquid Module (ULM)
Universal Liquid Module (ULM) and Dry Powder System (DPS)
3 product options available for selection
Product selection table with 3 available options. Use arrow keys to navigate and Enter or Space to select.
Catalog No. Includes
15655160 Dry Powder System (DPS)
15655159 Universal Liquid Module (ULM)
15655161 Universal Liquid Module (ULM) and Dry Powder System (DPS)
Use arrow keys to navigate between rows. Press Enter or Space to select a product option. 3 options available.
3 options
Catalog No. 15655160 Supplier Beckman Coulter Supplier No. C53019
Only null left

Description

Multiwavelength Particle Size Analyzer incorporates PIDS to provide a dynamic range down to 0.010 μm. The DPS is capable of measuring dry powder samples, while the ULM analyzes samples suspended in aqueous or non-aqueous dilutents.

  • Offers particle size distribution data from advanced Polarization Intensity Differential Scattering (PIDS) technology, which enables high-resolution measurements and an expanded dynamic range
  • 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
  • The XR particle size analyzer provides fast, accurate results, and helps streamline workflows for optimal efficiency
  • Dry Powder System (DPS) Module delivers reliable results from 400 nm to 3,500 μm for all types of homogeneous and heterogeneous samples that can be dispersed dry
  • Universal Liquid Module (ULM) analyzes samples suspended in aqueous or non-aqueous dilutents ranging in size from 0.010 μm to 2000 μm
  • Enhanced software simplifies method creation for standardized measurements
  • Provides accurate, reliable detection of multiple particle sizes in a single sample
  • New control standards adequately verify instrument/module performance
  • ADAPT Software features pass/fail results for faster quality control
  • High-security software configuration supports 21 CFR Part 11
  • Direct measurement range from 0.010 μm to 3,500 μm
  • Requires the LS 13 320 XR Workstation or customer-supplied Windows 10 PC that meets Beckman minimum specifications

Specifications

Product Type Particle Size Analyzer (Multi-wave Optical Bench)
Model LS 13 320 XR MW
Particle Size 0.010 μm to 2000 μm
For Use With (Application) Particle Size Analysis of Dry Powder, Aqueous, and Non-Aqueous Samples
For Use With (Equipment) Requires Controller, and Standard LS/HiCap Vacuum Unit
Includes Dry Powder System (DPS)